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Review: Techniques for Attaching Micro and Nano Particle Probes for AFM and NSOM

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[b]A Review of Techniques for Attaching and Modifying Micro and Nano Particle Probes for Surface Force and Near-field Optical Measurements
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REVIEW OF SCIENTIFIC INSTRUMENTS 78, 081101, 2007. DOI: 10.1063/1.2754076

Yang Gan

Chemical Engineering, School of Engineering, University of Newcastle, Callaghan, New South Wales 2308,
Australia and Department of Chemical and Biomolecular Engineering, University of Melbourne,
Victoria 3010, Australia

Abstract: Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications. © 2007 American Institute of Physics.

[[i] 本帖最后由 silly纳米 于 2007-09-04 16:17 编辑 [/i]]

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