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Scanning Electron Microscopy of Nanoscale Chemical Patterns

[b][size=5]Scanning Electron Microscopy of Nanoscale Chemical Patterns[/size][/b]
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Charan Srinivasan,†,‡ Thomas J. Mullen,† J. Nathan Hohman,† Mary E. Anderson,† Arrelaine A. Dameron,†,⊥ Anne M. Andrews,§ Elizabeth C. Dickey,∥ Mark W. Horn,‡ and  Paul S. Weiss†,*
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†Departments of Chemistry and Physics, ‡Department of Engineering Science and Mechanics, §Department of Veterinary and Biomedical Sciences and Huck Institutes of the Life Sciences, and ∥Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802-6300. ⊥Current address: Dynamic Organic Light, 2410 Trade Center Ave., Longmont, CO 80503. PT8DU*qHLt)d.L;T

LX i)E;Ne [b]ABSTRACT[/b]
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n a7FJ&b4]U@8p A series of nanoscale chemical patterning methods based on soft and hybrid nanolithographies have been characterized using scanning electron microscopy with corroborating evidence from scanning tunneling microscopy and lateral force microscopy. We demonstrate and discuss the unique advantages of the scanning electron microscope as an analytical tool to image chemical patterns of molecules highly diluted within a host self-assembled monolayer and to distinguish regions of differential mass coverage in patterned self-assembled monolayers. We show that the relative contrast of self-assembled monolayer patterns in scanning electron micrographs depends on the operating primary electron beam voltage, monolayer composition, and monolayer order, suggesting that secondary electron emission and scattering can be used to elucidate chemical patterns.
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V&n%O_9j/MmZy :web :hand [url]http://pubs.acs.org/cgi-bin/asap.cgi/ancac3/asap/html/nn7000799.html[/url]

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