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A PRACTICAL GUIDE TO SCANNING PROBE MICROSCOPY

[size=4][b]A PRACTICAL GUIDE TO SCANNING PROBE MICROSCOPY[/b]
[b]扫描探针显微镜实用指南[/b]
By Authors (first edition) :
Rebecca Howland and Lisa Benatar
[b][color=red]( 强烈推荐)[/color][/b]
目录
INTRODUCTION.................................................................................... V
CHAPTER 1 SPM TECHNIQUES ............................................................... 1
1.1 Scanning Tunneling Microscopy.......................................................... 2
1.2 Atomic Force Microscopy ...................................................... ........... 5
1.2.1 Contact AFM ................................................................................ 7
1.2.2 Non-contact AFM ........................................................................ 10
1.2.3 Intermittent-contact AFM.............................................................. 13
1.3 Magnetic Force Microscopy............................................................... 13
1.4 Lateral Force Microscopy................................................................... 15
1.5 Other SPM Techniques.................................................................... 17
1.5.1 Force Modulation Microscopy....................................................... 17
1.5.2 Phase Detection Microscopy ......................................................... 18
1.5.3 Electrostatic Force Microscopy ..................................................... 20
1.5.4 Scanning Capacitance Microscopy................................................ 21
1.5.5 Scanning Thermal Microscopy...................................................... 21
1.5.6 Near-field Scanning Optical Microscopy ...................................... 22
1.5.7Nanolithography ......................................................................... 22
1.6 SPMs as Surface Analysis Tools.......................................................... 26
1.6.1 Scanning Tunneling Spectroscopy................................................. 26
1.6.2 Force vs. Distance Curves.............................................................. 27
1.7 SPM Environments........................................................................... 30
1.7.1 Ultra-high Vacuum ...................................................................... 30
1.7.2Ambient...................................................................................... 31
1.7.3 Liquid........................................................................................ 31
1.7.4 Electrochemical........................................................................... 32
1.8 Further Reading ........................................................................... 32
CHAPTER 2 THE SCANNER ................................................................... 35
2.1 Scanner Design and Operation ........................................................ 36
2.2 Scanner Nonlinearities..................................................................... 39
2.2.1 Intrinsic Nonlinearity ..................................................................... 39
2.2.2 Hysteresis................................................................................... 40
2.2.3 Creep ....................................................................................... 42
2.2.4 Aging........................................................................................ 44
2.2.5 Cross Coupling............................................................................ 46
2.3 Software Correction...................................................................... 48
2.4 Hardware Correction ..................................................................... 49
2.4.1 Optical Techniques .................................................................... 51
2.4.2 Capacitive Techniques................................................................... 51
2.4.3 Strain-gauge Techniques............................................................. 51
2.5 Tests for Scanner Linearity ............................................................. 52
2.5.1 Intrinsic Nonlinearity ..................................................................... 52
2.5.2 Hysteresis................................................................................... 53
2.5.3 Creep ....................................................................................... 53
2.5.4 Aging........................................................................................ 55
2.5.5 Cross Coupling........................................................................... 56
2.5.6 Step Profile: Hysteresis, Creep, and Cross Coupling in Z............ 56
2.6 Further Reading ......................................................................... 57
CHAPTER 3 SPM PROBES .................................................................. 58
3.1 Introduction ............................................................................. 58
3.2 Cantilevers ................................................................................ 58
3.2.1 Properties of Cantilevers................................................................ 59
3.3 Tip Shape and Resolution................................................................ 60
3.4 How to Select a Probe ................................................................... 65
3.5 Probe Handling ............................................................................. 69
3.6 Further Reading ............................................................................ 69
CHAPTER 4 IMAGE ARTIFACTS ............................................................. 70     
4.1     Tip Convolution......................................................................... 70     
4.2     Convolution with Other Physics.................................................. 73     
4.3     Feedback Artifacts.................................................................... 73     
4.4     Image Processing Capabilities................................................... 74     
4.5     Test for Artifacts...................................................................... 75     
4.6     Further Reading ....................................................................... 75     
CHAPTER 5 KEY FEATURES OF SPMS ................................................... 76     
5.1     User Interface .......................................................................... 76     
5.2     Optical Microscope .................................................................. 76     
5.3     Probe Handling ......................................................................... 78     
5.4     System Accessibility............................................................. 78     
Notes:.......................................................................................... 1   [/size]

[[i] 本帖最后由 nanoquebec 于 2006-11-15 20:29 编辑 [/i]]

下载学习!:victory:

:) :) 已下载，非常感谢。

thanks! NQ thanks

Reply #1 nanoquebec's post

Thanks !!:victory:

Reply #1 nanoquebec's post

thanks for the link